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Machine learning-assisted high-throughput prediction and experimental validation of high-responsivity extreme ultraviolet detectors

Author(s): Ayyubi RAW; Low MX; Salimi S; Khorsandi M; Hossain MM; Arooj H; Masood S; Zeb MH; Mahmood N; Bao Q; Walia S; Shabbir B;

Identifying materials with optimal optoelectronic properties for targeted applications represents both a critical need and a persistent challenge in optoelectronic device engineering. Machine learning models often depend on extensive datasets, which are typically lacking in specialized research d ...

Article GUID: 40624020


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