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An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films

Author(s): Simbrunner J; Schrode B; Domke J; Fritz T; Salzmann I; Resel R;

Crystal structure identification of thin organic films entails a number of technical and methodological challenges. In particular, if molecular crystals are epitaxially grown on single-crystalline substrates a complex scenario of multiple preferred orientat...

Article GUID: 32356785
Indexing of grazing-incidence X-ray diffraction patterns: the case of fibre-textured thin films.

Author(s): Simbrunner J, Simbrunner C, Schrode B, Röthel C, Bedoya-Martinez N, Salzmann I, Resel R

Acta Crystallogr A Found Adv. 2018 Jul 01;74(Pt 4):373-387 Authors: Simbrunner J, Simbrunner C, Schrode B, Röthel C, Bedoya-Martinez N, Salzmann I, Resel R

Article GUID: 29978847