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Invariant Pattern Recognition with Log-Polar Transform and Dual-Tree Complex Wavelet-Fourier Features

Author(s): Chen G; Krzyzak A;

In this paper, we propose a novel method for 2D pattern recognition by extracting features with the log-polar transform, the dual-tree complex wavelet transform (DTCWT), and the 2D fast Fourier transform (FFT2). Our new method is invariant to translation, r ...

Article GUID: 37112182


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